Non-contact film thickness gauge "FF8" *Custom specifications and other adaptations available!
The measurement data can be saved to a file, and re-analysis is possible later with a non-contact film thickness measurement system!
The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveforms) and analyzes film thickness values using methods such as FFT (Fast Fourier Transform film thickness gauge) and curve fitting film thickness gauges. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. 【Standard Measurement】 Measurement Range (Resolution) Corresponding Specifications 0.0010 to 100μm Thin film + thin film analysis specifications 0.0100 to 100μm Standard + thin film analysis specifications 0.5000 to 500μm Standard specifications 1.000 to 500μm Pressure film 1 specifications 4.000 to 2000μm Pressure film 2 specifications *Other measurement ranges can be accommodated with options. *For more details, please refer to the PDF document or feel free to contact us.
- Company：システムロード
- Price：Other
